"XPS study during a soft and progressive sputtering of a monolayer on indium phosphide by argon cluster bombardment " D. Aureau, M. Frégnaux, C. Njel, J. Vigneron, M. Bouttemy, A.-M. Gonçalves, A. Etcheberry, Surf. Int. Anal. 50,11 2018
"Etching and Chemical Control of the Silicon Nitride Surface" M.Brunet, D. Aureau, P. Chantraine, F. Guillemot, A. Etcheberry, A.-C. Gouget Laemmel, F. Ozanam, ACS Appl. Mat. Inter. 9 (3) 2017 3075-3084
"The critical role of wavelength in the UV-activated grafting of 1-alkene onto silicon and silicon nitride SixN4 surfaces" M. Brunet, D. Aureau, F. Guillemot, A. Etcheberry, F. Ozanam, A.-C. Gouget-Laemmel, Chem Comm. 54 2018 7167-7170
"Advanced analysis tool for X-ray photoelectron spectroscopy profiling: Cleaning of perovskite SrTiO3 oxide surface using argon cluster ion source" D. Aureau, K. Ridier, B.Bérini, Y. Dumont, N. Keller, J. Vigneron, A. Etcheberry, A.Fouchet. Thin Solid Films 601 2016 89-92
"Enhanced Depth Profiling of Perovskite Oxide: Low Defect Levels Induced in SrTiO3 by Argon Cluster Sputtering "K. Ridier, D. Aureau, B.Bérini, Y. Dumont,N. Keller, J. Vigneron, A. Etcheberry, A.Fouchet J. Phys. Chem. C , 120, 2016 21358−21363
"Tuning the Electronic Properties of LAO/STO Interfaces by Irradiating LAO Surface with Low-Energy Cluster Ion Beams " K. Ridier, D. Aureau, B. Bérini, Y. Dumont, N. Keller, J. Vigneron, A. Etcheberry, B. Domengès, and A. Fouchet Phys. Rev B 97 2018 035146
"Etching and Chemical Control of the Silicon Nitride Surface" M.Brunet, D. Aureau, P. Chantraine, F. Guillemot, A. Etcheberry, A.-C. Gouget Laemmel, F. Ozanam, ACS Appl. Mat. Inter. 9 (3) 2017 3075-3084
"The critical role of wavelength in the UV-activated grafting of 1-alkene onto silicon and silicon nitride SixN4 surfaces" M. Brunet, D. Aureau, F. Guillemot, A. Etcheberry, F. Ozanam, A.-C. Gouget-Laemmel, Chem Comm. 54 2018 7167-7170
"Advanced analysis tool for X-ray photoelectron spectroscopy profiling: Cleaning of perovskite SrTiO3 oxide surface using argon cluster ion source" D. Aureau, K. Ridier, B.Bérini, Y. Dumont, N. Keller, J. Vigneron, A. Etcheberry, A.Fouchet. Thin Solid Films 601 2016 89-92
"Enhanced Depth Profiling of Perovskite Oxide: Low Defect Levels Induced in SrTiO3 by Argon Cluster Sputtering "K. Ridier, D. Aureau, B.Bérini, Y. Dumont,N. Keller, J. Vigneron, A. Etcheberry, A.Fouchet J. Phys. Chem. C , 120, 2016 21358−21363
"Tuning the Electronic Properties of LAO/STO Interfaces by Irradiating LAO Surface with Low-Energy Cluster Ion Beams " K. Ridier, D. Aureau, B. Bérini, Y. Dumont, N. Keller, J. Vigneron, A. Etcheberry, B. Domengès, and A. Fouchet Phys. Rev B 97 2018 035146