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The Center for Study and Training in Electron Spectroscopies (CEFS2) provides access to the physico-chemistry of surfaces taken in all its dimensions (high resolution in energy and chemical environment, trace detection, ability to access the distribution of composition perpendicular to the surface, distribution in the plane of the surface, access to inhomogeneity up to nanometric dimensions, etc.). The center contains 3 XPS spectrometers, a Nano-Auger spectrometer and a SEM-FEG-EDX-EBSD.
A particular partnership exists with IPVF. It is reflected in the full-time reception of a postdoctoral fellow on Project I and the installation on the UFR site of the UVSQ Sciences (Versailles site), of an IPVF platform dedicated to surface chemical analysis (XPS K Alpha + and GD OES), with strong support from CNRS and UVSQ. This IPVF platform is under the technical responsibility (maintenance, implementation and management) of CEFS2 engineers.


 XPS spectrometers provide elemental and chemical  information of various materials (solids, powders, polymers, etc.) with a lateral resolution of 10 to 600 μm and a depth of analysis less than 10 nm.
Higher depths can be reached by profiling using  ionic abrasion (mono or polyatomic). Angular analysis is also possible. Flood gun compensation allows the study of conductive but also insulating materials. Various materials (solids, powders, polymers, etc.) with a lateral resolution of 10 to 600 μm and a depth of analysis of less than 10 nm.



The  250 Xi Escalab offers a very high energy resolution. A helium lamp allows measurements of UV spectroscopy (UPS) giving access to the valence bands. The use of Helium light ions makes it possible to access the composition of the first atomic layer (Low Energy Ion Scattering). A REELS module (Reflection Electron Energy Loss Spectroscopy) allows access to hydrogen,  an element non-probed by XPS.

The Theta Probe device allows  analysis in the first nanometers by angular resolution without moving the samples.

Thanks to its small spot size, the Nexsa  offers a resolution of ten microns giving access to elementary chemical maps and environments


The JAMP 9500 F Nano-AES (+ EDS) spectrometer enables qualitative and quantitative analyzes on essentially conductive materials. Several modes are accessible (points, lines, cartography). The analysis depth is less than 5 nm for a lateral resolution of 10 to a few hundred nanometers. Angular analysis is possible by tilt, in depth by sequential ionic abrasion and by volume by EDS (from Na Z = 11


The  JSM 7001 F microscope is equipped with an EDS detector allowing qualitative and quantitative analyzes on a depth of 300 nm to 2 microns with a micrometric side resolution. Different modes, points, lines and cartography are accessible. It is also equipped with an EBSD module allowing crystallographic analyzes (grain size, orientation, texturing) on polished samples

Centre de formation en spectroscopies d'électrons

University, CNRS entreprise, conferences

The "Centre d'Etude et de Formation en Spectroscopies d'Electrons"  of the   Lavoisier Institute is opened to academic and industrial researchers .

Muriel Bouttemy
Mathieu Frégnaux